Imaging foundation model for universal enhancement of non-ideal measurement CT
R
Rongjun Ge
Y
Yuxin Liu
Z
Zhan Wu
S
Shangwen Yang
Y
Yuan Gao
C
Chenyu You
G
Ge Wang
S
Shuo Li
Y
Yuting He
(Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences (CAS), 398 Ruoshui Road, Suzhou 215123, China)
Y
Yang Chen
Article Details
Journal
Nature Communications
Volume / Issue
Vol. 17, Issue 1
Published
June 04, 2026
ISSN
2041-1723
Publisher
Nature Portfolio
Authors (10)
R
Rongjun Ge
Y
Yuxin Liu
Z
Zhan Wu
S
Shangwen Yang
Y
Yuan Gao
C
Chenyu You
G
Ge Wang
S
Shuo Li
Y
Yuting He
Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences (CAS), 398 Ruoshui Road, Suzhou 215123, China
Y
Yang Chen
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