High-frequency electrical behavior in V3O5 thin films

C Camilo Verbel (Physics Department, University of Puerto Rico 1 , Mayagüez, Puerto Rico 00680,) A Alexander Bartenev (Department of Physics, University of Puerto Rico 1 , Mayagüez, Puerto Rico 00681,) M Manuel Lozano F Fernando Camino R Rafael A. Rodríguez-Solís (Electrical Engineering Department, University of Puerto Rico 2 , Mayagüez, Puerto Rico 00680,) A Armando Rúa (Department of Physics, University of Puerto Rico 1 , Mayagüez, Puerto Rico 00681,)

Abstract

Vanadium oxides are known for their metal–insulator transition (MIT), with V3O5 being notable for its transition temperature exceeding room temperature. At about 430 K, this material shows a change in crystal symmetry accompanied with one order of magnitude increase in its electrical conductivity and alterations in its optical properties. Although the property changes during the MIT in V3O5 are less pronounced than those observed in VO2, its transition temperature is 90 K higher, making it appealing for applications requiring elevated temperatures. In this article, the high-frequency characteristics were determined in a V3O5 two-terminal device in the range from 5 to 35 GHz. The S-parameters showed that the return loss at room temperature was close to −1.5 dB, and the isolation between ports was approximately −50 dB. At temperatures above the metal–insulator transition, the isolation decreased to around −40 dB at 35 GHz. For S11 and S22, similar behavior was observed at room temperature, with a notable change in the S-parameter phase of the device. This behavior suggests that V3O5 may function well as a capacitor because the considerable change in phase could control the flow of electrical signals in devices. This property also may be used for matching purposes, especially considering its response to temperature changes. Additionally, conductivity calculation from S-parameters shows a decrease of approximately two orders of magnitude at 500 K and one order of magnitude at 300 K compared to DC values. These findings highlight V3O5 potential for integration into radio frequency devices that demand consistent performance in high-temperature environments.

Article Details

Volume / Issue Vol. 137, Issue 23
Published June 21, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (6)

C

Camilo Verbel

Physics Department, University of Puerto Rico 1 , Mayagüez, Puerto Rico 00680,

A

Alexander Bartenev

Department of Physics, University of Puerto Rico 1 , Mayagüez, Puerto Rico 00681,

M

Manuel Lozano

F

Fernando Camino

R

Rafael A. Rodríguez-Solís

Electrical Engineering Department, University of Puerto Rico 2 , Mayagüez, Puerto Rico 00680,

A

Armando Rúa

Department of Physics, University of Puerto Rico 1 , Mayagüez, Puerto Rico 00681,