Heliometric stereo: A new frontier in surface profilometry

A Aleksandar Radić (Department of Physics, Cavendish Laboratory) S Sam M. Lambrick (Department of Physics, Cavendish Laboratory, University of Cambridge 1 , 19 J.J. Thomson Avenue, Cambridge CB3 0HE,) C Chenyang Zhao N Nick A. von Jeinsen (Department of Physics, Cavendish Laboratory, University of Cambridge 1 , 19 J.J. Thomson Avenue, Cambridge CB3 0HE,) A Andrew P. Jardine (Cavendish Laboratory, Department of Physics, University of Cambridge , JJ Thomson Avenue, Cambridge,) D David J. Ward (Cavendish Laboratory, Department of Physics, University of Cambridge , JJ Thomson Avenue, Cambridge,) P Paul C. Dastoor (Cavendish Laboratory, University of Cambridge 1 , J. J. Thompson Avenue, Cambridge CB3 0US,)

Abstract

Accurate and reliable measurements of three-dimensional surface structures are important for a broad range of technological and research applications, including materials science, nanotechnology, and biomedical research. Scanning helium microscopy (SHeM) uses low-energy (∼64meV) neutral helium atoms as the imaging probe particles, providing a highly sensitive and delicate approach to measuring surface topography. To date, topographic SHeM measurements have been largely qualitative, but with the advent of the heliometric stereo method—a technique that combines multiple images to create a 3D representation of a surface—quantitative maps of surface topography may now be acquired with SHeM. Here, we present and discuss two different implementations of heliometric stereo on two separate instruments, a single-detector SHeM and a multiple-detector SHeM. Both implementations show good accuracy (5% and 10%, respectively) for recovering the shape of a surface. Additionally, we discuss where heliometric stereo is most applicable, identify contrast features that can limit its accuracy, and discuss how to mitigate these limitations with careful design and sample choices that be readily implemented on current instruments.

Article Details

Volume / Issue Vol. 138, Issue 4
Published July 28, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (7)

A

Aleksandar Radić

Department of Physics, Cavendish Laboratory

S

Sam M. Lambrick

Department of Physics, Cavendish Laboratory, University of Cambridge 1 , 19 J.J. Thomson Avenue, Cambridge CB3 0HE,

C

Chenyang Zhao

N

Nick A. von Jeinsen

Department of Physics, Cavendish Laboratory, University of Cambridge 1 , 19 J.J. Thomson Avenue, Cambridge CB3 0HE,

A

Andrew P. Jardine

Cavendish Laboratory, Department of Physics, University of Cambridge , JJ Thomson Avenue, Cambridge,

D

David J. Ward

Cavendish Laboratory, Department of Physics, University of Cambridge , JJ Thomson Avenue, Cambridge,

P

Paul C. Dastoor

Cavendish Laboratory, University of Cambridge 1 , J. J. Thompson Avenue, Cambridge CB3 0US,