Green Fabrication of Sulfonium‐Containing Bismuth Materials for High‐Sensitivity X‐Ray Detection

A Allan Starkholm (Department Solution‐Processing of Hybrid Materials and Devices Helmholtz‐Zentrum Berlin 14109 Berlin Germany) D Dominik Al‐Sabbagh (Federal Institute for Materials Research and Testing (BAM) Richard‐Willstätter Str 11 Berlin 12489 Germany) S Sema Sarisozen (Freigeist Juniorgroup, Radiation Tolerant Electronics with Soft Semiconductors (ROSI) University of Potsdam 14476 Potsdam‐Golm Germany) A Alexander von Reppert M Matthias Rössle (Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Wilhelm-Conrad-Röntgen Campus, BESSY II 2 , 12489 Berlin,) M Markus Ostermann E Eva Unger F Franziska Emmerling (Department of Materials Chemistry, Federal Institute for Materials Research and Testing, Richard-Willstätter-Str. 11, 12489 Berlin, Germany) L Lars Kloo (Applied Physical Chemistry, Department of Chemistry KTH Royal Institute of Technology Stockholm SE‐114 28 Sweden) P Per H. Svensson (Applied Physical Chemistry, Department of Chemistry KTH Royal Institute of Technology Stockholm SE‐114 28 Sweden) F Felix Lang O Olena Maslyanchuk (Department Solution‐Processing of Hybrid Materials and Devices Helmholtz‐Zentrum Berlin 14109 Berlin Germany)

Abstract

AbstractOrganic–inorganic hybrid materials based on lead and bismuth have recently been proposed as novel X‐ and gamma‐ray detectors for medical imaging, non‐destructive testing, and security, due to their high atomic numbers and facile preparation compared to traditional materials like amorphous selenium and Cd(Zn)Te. However, challenges related to device operation, excessively high dark currents, and long‐term stability have delayed commercialization. Here, two novel semiconductors incorporating stable sulfonium cations are presented, [(CH3CH2)3S]6Bi8I30 and [(CH3CH2)3S]AgBiI5, synthesized via solvent‐free ball milling and fabricated into dense polycrystalline pellets using cold isostatic compression, two techniques that can easily be upscaled, for X‐ray detection application. The fabricated detectors exhibit exceptional sensitivities (14 100–15 190 µC Gyair−1 cm−2) and low detection limits (90 nGyair s−1 for [(CH3CH2)3S]6Bi8I30 and 78 nGyair s−1 for [(CH3CH2)3S]AgBiI5), far surpassing current commercial detectors. Notably, they maintain performance after 9 months of ambient storage. The findings highlight [(CH3CH2)3S]6Bi8I30 and [(CH3CH2)3S]AgBiI5 as scalable, cost‐effective and highly stable alternatives to traditional semiconductor materials, offering great potential as X‐ray detectors in medical and security applications.

Article Details

Volume / Issue Vol. 37, Issue 24
Published June 01, 2025
ISSN 0935-9648
Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (12)

A

Allan Starkholm

Department Solution‐Processing of Hybrid Materials and Devices Helmholtz‐Zentrum Berlin 14109 Berlin Germany

D

Dominik Al‐Sabbagh

Federal Institute for Materials Research and Testing (BAM) Richard‐Willstätter Str 11 Berlin 12489 Germany

S

Sema Sarisozen

Freigeist Juniorgroup, Radiation Tolerant Electronics with Soft Semiconductors (ROSI) University of Potsdam 14476 Potsdam‐Golm Germany

A

Alexander von Reppert

M

Matthias Rössle

Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Wilhelm-Conrad-Röntgen Campus, BESSY II 2 , 12489 Berlin,

M

Markus Ostermann

E

Eva Unger

F

Franziska Emmerling

Department of Materials Chemistry, Federal Institute for Materials Research and Testing, Richard-Willstätter-Str. 11, 12489 Berlin, Germany

L

Lars Kloo

Applied Physical Chemistry, Department of Chemistry KTH Royal Institute of Technology Stockholm SE‐114 28 Sweden

P

Per H. Svensson

Applied Physical Chemistry, Department of Chemistry KTH Royal Institute of Technology Stockholm SE‐114 28 Sweden

F

Felix Lang

O

Olena Maslyanchuk

Department Solution‐Processing of Hybrid Materials and Devices Helmholtz‐Zentrum Berlin 14109 Berlin Germany