Giant photorefractive and photoexpansion effects in a van der Waals semiconductor

A Anton A. Minnekhanov (Emerging Technologies Research Center, XPANCEO) G Georgy A. Ermolaev (Emerging Technologies Research Center, XPANCEO) A Alexey P. Tsapenko (Emerging Technologies Research Center, XPANCEO) I Ilia M. Fradkin (Emerging Technologies Research Center, XPANCEO) G Gleb I. Tselikov (Emerging Technologies Research Center, XPANCEO) A Adilet N. Toksumakov (Emerging Technologies Research Center, XPANCEO) A Aleksandr S. Slavich (Emerging Technologies Research Center, XPANCEO) A Arslan B. Mazitov (Emerging Technologies Research Center, XPANCEO) S Sergey A. Smirnov (Emerging Technologies Research Center, XPANCEO) N Nikita D. Orekhov (Emerging Technologies Research Center, XPANCEO) I Ivan A. Kruglov (Emerging Technologies Research Center, XPANCEO) S Sergei A. Ivanov (Materials Physics and Applications Division and Center for Integrated Nanotechnologies) I Ilya P. Radko (Emerging Technologies Research Center, XPANCEO) A Andrey A. Vyshnevyy (Emerging Technologies Research Center, XPANCEO) A Aleksey V. Arsenin (Emerging Technologies Research Center, XPANCEO) K Kostya S. Novoselov V Valentyn S. Volkov (Emerging Technologies Research Center, XPANCEO)

Abstract

Nanophotonics relies on precise nanoscale structuring, yet conventional fabrication techniques remain complex and costly. Layered van der Waals (vdW) materials, with their intrinsic anisotropy and high refractive indices, offer a promising route toward simplified nanostructuring and tunable optical functionality. However, no vdW material has previously been shown to exhibit a strong photorefractive effect—a key requirement for light-based modulation. Here, we report a giant photorefractive response (Δ n up to 0.3) in crystalline arsenic trisulfide (As 2 S 3 ), observed at low optical intensities. In addition to refractive-index modulation, light exposure enables controlled thickness tuning of As 2 S 3 . The material exhibits a giant photoexpansion of up to 7%, depending on the illumination intensity, which may originate from light-induced generation of point defects, consistent with molecular-dynamics modeling. Building on this photoexpansion effect, we introduce a maskless nanopatterning technique based on continuous-wave laser writing, achieving ~500 nm pitch (~50,000 dpi) without the need for ultrafast lasers. The combination of high photosensitivity, anisotropy, ease of exfoliation and transfer, and optical transparency positions vdW As 2 S 3 as a practical platform for integrated photonics, adaptive optics, reconfigurable photonic elements, and dense optical encoding.

Article Details

Volume / Issue Vol. 123, Issue 13
Published March 31, 2026
ISSN 0027-8424
Publisher National Academy of Sciences

Authors (17)

A

Anton A. Minnekhanov

Emerging Technologies Research Center, XPANCEO

G

Georgy A. Ermolaev

Emerging Technologies Research Center, XPANCEO

A

Alexey P. Tsapenko

Emerging Technologies Research Center, XPANCEO

I

Ilia M. Fradkin

Emerging Technologies Research Center, XPANCEO

G

Gleb I. Tselikov

Emerging Technologies Research Center, XPANCEO

A

Adilet N. Toksumakov

Emerging Technologies Research Center, XPANCEO

A

Aleksandr S. Slavich

Emerging Technologies Research Center, XPANCEO

A

Arslan B. Mazitov

Emerging Technologies Research Center, XPANCEO

S

Sergey A. Smirnov

Emerging Technologies Research Center, XPANCEO

N

Nikita D. Orekhov

Emerging Technologies Research Center, XPANCEO

I

Ivan A. Kruglov

Emerging Technologies Research Center, XPANCEO

S

Sergei A. Ivanov

Materials Physics and Applications Division and Center for Integrated Nanotechnologies

I

Ilya P. Radko

Emerging Technologies Research Center, XPANCEO

A

Andrey A. Vyshnevyy

Emerging Technologies Research Center, XPANCEO

A

Aleksey V. Arsenin

Emerging Technologies Research Center, XPANCEO

K

Kostya S. Novoselov

V

Valentyn S. Volkov

Emerging Technologies Research Center, XPANCEO