Geometry-aware localization evaluation of grad-CAM for wafer map defect classification
T
Tushar Dudeja
P
Prachi Sharma
Article Details
Journal
Scientific Reports
Volume / Issue
Vol. 16, Issue 1
Published
May 24, 2026
ISSN
2045-2322
Publisher
Nature Portfolio
Authors (2)
T
Tushar Dudeja
P
Prachi Sharma
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