Geometric dependence of Josephson junction normal-state resistance for superconducting qubit design

D Dae-Yun Kim S Seon-Myeong Choi (Samsung Advanced Institute of Technology, Samsung Electronics , Suwon 16678,) D Dae Seok Han J June-Young M. Lee K Kiho Kim (Department of Physics & Astronomy) H Hyeokshin Kwon J Jaeho Shin

Abstract

Josephson junctions (JJs) are critical components in superconducting quantum circuits, where their electrical properties directly determine qubit transition frequencies. While advances in fabrication have enabled precise control over junction area and oxide thickness, the influence of junction geometry beyond area has remained largely unexplored. Here, we report clear and reproducible evidence that the normal-state resistance (Rn) of JJs depends strongly on geometric parameters, demonstrating that (Rn) exhibits a systematic and reproducible dependence on junction geometry beyond simple area scaling. To account for this behavior, we introduce an edge-resistance model that incorporates perimeter-related contributions to (Rn). Our findings highlight the crucial role of geometric design in JJ electrical characteristics and provide a practical framework for improving frequency precision and uniformity in large-scale superconducting quantum processors.

Article Details

Volume / Issue Vol. 139, Issue 11
Published March 21, 2026
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (7)

D

Dae-Yun Kim

S

Seon-Myeong Choi

Samsung Advanced Institute of Technology, Samsung Electronics , Suwon 16678,

D

Dae Seok Han

J

June-Young M. Lee

K

Kiho Kim

Department of Physics & Astronomy

H

Hyeokshin Kwon

J

Jaeho Shin