Full Crystallographic Imaging of Hexagonal Boron Nitride Monolayers with Phonon‐Enhanced Sum‐Frequency Microscopy

N Niclas S. Mueller (Fritz‐Haber‐Institut der Max‐Planck‐Gesellschaft Berlin Germany) A Alexander P. Fellows (Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, Berlin 14195, Germany) B Ben John (Department of Physical Chemistry Fritz‐Haber‐Institute of the Max‐Planck‐Society 14195 Berlin Germany) A Andrew E. Naclerio (Chemical and Biomolecular Engineering Department Vanderbilt University Nashville TN 37212 USA) C Christian Carbogno (Fritz‐Haber‐Institut der Max‐Planck‐Gesellschaft Berlin Germany) K Katayoun Gharagozloo‐Hubmann (Department of Physics Freie Universität Berlin 14195 Berlin Germany) D Damián Baláž (Theory Department Fritz‐Haber‐Institute of the Max‐Planck‐Society 14195 Berlin Germany) R Ryan A. Kowalski (Vanderbilt University Nashville TN USA) H Hendrik H. Heenen (Fritz-Haber-Institute of the Max-Planck-Society 23 , Berlin,) C Christoph Scheurer (Fritz-Haber Institute of the Max Planck Society 1 , Berlin (DE),) K Karsten Reuter (Theory Department, Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, 14195 Berlin, Germany) J Joshua D. Caldwell (Department of Mechanical Engineering Vanderbilt University Nashville Tennessee USA) M Martin Wolf (Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, Berlin 14195, Germany) P Piran R. Kidambi (Mechanical and Aerospace Engineering Department University of Florida Gainesville FL 32611 USA) M Martin Thämer (Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, Berlin 14195, Germany) A Alexander Paarmann (Department of Physcial Chemistry Fritz Haber Institute of the Max Planck Society Berlin Germany)

Abstract

Abstract Hexagonal boron nitride (hBN) is an important 2D material for van der Waals heterostructures, single photon emitters, and infrared nanophotonics. The optical characterization of mono‐ and few‐layer samples of hBN however, remains a challenge as the material is almost invisible optically. Here, phase‐resolved sum‐frequency microscopy is introduced as a technique for imaging monolayers of hBN grown by chemical vapor deposition (CVD) and visualizing their crystal orientation. Femtosecond mid‐infrared (IR) and visible laser pulses are used for sum‐frequency generation (SFG), which is imaged in a wide‐field optical microscope. The IR laser resonantly excites a phonon of hBN that leads to an ≈800‐fold enhancement of the SFG intensity, making it possible to image large 100 × 100 µm 2 sample areas in less than 1 s. Heterodyne detection combined with azimuthal sample rotation further provides full crystallographic information. Combined knowledge of topography and crystal orientation reveals that triangular domains of CVD‐grown monolayer hBN have nitrogen‐terminated zigzag edges. Overall, SFG microscopy is an ultra‐sensitive tool with the potential to image crystal structure, strain, stacking sequences, and twist angles in a wide range of van der Waals structures, where locating and identifying monolayer regions and interfaces with broken inversion symmetry is of paramount importance.

Article Details

Volume / Issue Vol. 38, Issue 7
Published February 01, 2026
ISSN 0935-9648
Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (16)

N

Niclas S. Mueller

Fritz‐Haber‐Institut der Max‐Planck‐Gesellschaft Berlin Germany

A

Alexander P. Fellows

Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, Berlin 14195, Germany

B

Ben John

Department of Physical Chemistry Fritz‐Haber‐Institute of the Max‐Planck‐Society 14195 Berlin Germany

A

Andrew E. Naclerio

Chemical and Biomolecular Engineering Department Vanderbilt University Nashville TN 37212 USA

C

Christian Carbogno

Fritz‐Haber‐Institut der Max‐Planck‐Gesellschaft Berlin Germany

K

Katayoun Gharagozloo‐Hubmann

Department of Physics Freie Universität Berlin 14195 Berlin Germany

D

Damián Baláž

Theory Department Fritz‐Haber‐Institute of the Max‐Planck‐Society 14195 Berlin Germany

R

Ryan A. Kowalski

Vanderbilt University Nashville TN USA

H

Hendrik H. Heenen

Fritz-Haber-Institute of the Max-Planck-Society 23 , Berlin,

C

Christoph Scheurer

Fritz-Haber Institute of the Max Planck Society 1 , Berlin (DE),

K

Karsten Reuter

Theory Department, Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, 14195 Berlin, Germany

J

Joshua D. Caldwell

Department of Mechanical Engineering Vanderbilt University Nashville Tennessee USA

M

Martin Wolf

Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, Berlin 14195, Germany

P

Piran R. Kidambi

Mechanical and Aerospace Engineering Department University of Florida Gainesville FL 32611 USA

M

Martin Thämer

Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, Berlin 14195, Germany

A

Alexander Paarmann

Department of Physcial Chemistry Fritz Haber Institute of the Max Planck Society Berlin Germany