Field-material coupled neural network: A novel zero-shot physics-informed learning inverse problem solver for extracting complex dielectric constant in terahertz band

P Pengfei Zhu (MSD China, Shanghai) S Stefano Sfarra E Elena Pivarčiová (Department of Manufacturing and Automation Technology, Technical University in Zvolen 4 , 96053 Zvolen,) C Carlo Santulli (Geology Division, School of Science and Technology (SST), Università degli Studi di Camerino 4 , Camerino,) X Xavier Maldague (Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory (CVSL), Laval University 1 , Québec G1V 0A6,)

Abstract

Accurate extraction of the complex dielectric constant in the terahertz (THz) band is essential for material characterization and non-destructive evaluation yet remains challenging due to the ill-posed nature of electromagnetic inverse problems and the limited availability of reliable reference data. In this work, a field-material couple neural network (FMCNN) is proposed to retrieve the complex dielectric constant directly from THz measurements. The FMCNN consists of a field neural network and a material neural network that are strongly coupled through the frequency-domain Maxwell equations in the form of a Helmholtz equation, with the governing physics enforced by partial differential equation and boundary condition constraints. This formulation enables zero-shot physics-informed learning inversion, requiring only measured test data as input. The extracted dielectric constants are validated by comparison with results from a one-dimensional normal-incidence model and the Drude–Lorentz model, showing good agreement over a broad frequency range, particularly above 0.2 THz. These results demonstrate that the FMCNN provides a physics-consistent and data-efficient approach for material parameter extraction in the THz band, offering an alternative to conventional model-based methods.

Article Details

Volume / Issue Vol. 139, Issue 23
Published June 21, 2026
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (5)

P

Pengfei Zhu

MSD China, Shanghai

S

Stefano Sfarra

E

Elena Pivarčiová

Department of Manufacturing and Automation Technology, Technical University in Zvolen 4 , 96053 Zvolen,

C

Carlo Santulli

Geology Division, School of Science and Technology (SST), Università degli Studi di Camerino 4 , Camerino,

X

Xavier Maldague

Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory (CVSL), Laval University 1 , Québec G1V 0A6,