Extending the low-frequency limit of time-domain thermoreflectance via periodic waveform analysis

Abstract

Time-domain thermoreflectance (TDTR) is a powerful technique for characterizing the thermal properties of layered materials. However, its effectiveness at modulation frequencies below 0.1 MHz is hindered by pulse accumulation effects, limiting its ability to accurately measure in-plane thermal conductivities below 6W/(mK). In this study, we present a periodic waveform analysis-based TDTR (PWA-TDTR) method that extends the measurable frequency range down to 50 Hz with minimal modifications to the conventional setup. This advancement greatly enhances measurement sensitivity, enabling accurate measurements of in-plane thermal conductivities as low as 0.2W/(mK). We validate the technique by measuring polymethyl methacrylate and fused silica, using PWA-TDTR to obtain in-plane thermal diffusivity and conventional TDTR to measure cross-plane thermal effusivity. Together, these allow the extraction of both thermal conductivity and volumetric heat capacity, with results in excellent agreement with literature values. We further demonstrate the versatility of PWA-TDTR through (1) thermal conductivity and heat capacity measurements of thin liquid films and (2) depth-resolved thermal conductivity profiling in lithium niobate crystals, revealing point defect-induced inhomogeneities at depths up to 100 μm. By overcoming frequency and sensitivity constraints, PWA-TDTR significantly expands the applicability of TDTR, enabling detailed investigations of thermal transport in materials and conditions that were previously challenging to study.