Evaluation of the interfacial bonding strength between hafnia and silica layers deposited by electron-beam evaporation
D
D. Broege
B
B. N. Hoffman
M
M. Mireles
A
A. L. Rigatti
S
S. G. Demos
J
J. C. Lambropoulos
Article Details
Journal
Scientific Reports
Volume / Issue
Vol. 16, Issue 1
Published
May 13, 2026
ISSN
2045-2322
Publisher
Nature Portfolio
Authors (6)
D
D. Broege
B
B. N. Hoffman
M
M. Mireles
A
A. L. Rigatti
S
S. G. Demos
J
J. C. Lambropoulos
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