Enhancing InGaZnO transistor current through high-κ dielectrics and interface trap extraction using single-pulse charge pumping
J
JaeHyeong Park
H
Hyo-Bae Kim
S
Sang Min Yu
K
Kihwan Kim
J
Ju Heyuck Baeck
J
Jiyong Noh
K
Kwon-Shik Park
S
Soo-Young Yoon
J
Ji-Hoon Ahn
S
Saeroonter Oh
Article Details
Journal
Scientific Reports
Volume / Issue
Vol. 15, Issue 1
Published
July 02, 2025
ISSN
2045-2322
Publisher
Nature Portfolio
Authors (10)
J
JaeHyeong Park
H
Hyo-Bae Kim
S
Sang Min Yu
K
Kihwan Kim
J
Ju Heyuck Baeck
J
Jiyong Noh
K
Kwon-Shik Park
S
Soo-Young Yoon
J
Ji-Hoon Ahn
S
Saeroonter Oh
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