Electrostatically induced electron hole carrier separation in a silicon multi bridge channel FET for enhanced SRAM performance
S
S. Ashok Kumar
B
Binola K. Jebalin I.V
H
Husna Hamza
J
Julie Roslita Rusli
N
Nirmal D
Article Details
Journal
Scientific Reports
Volume / Issue
Vol. 1, Issue 1
Published
July 29, 2026
ISSN
2045-2322
Publisher
Nature Portfolio
Authors (5)
S
S. Ashok Kumar
B
Binola K. Jebalin I.V
H
Husna Hamza
J
Julie Roslita Rusli
N
Nirmal D
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