Electrostatic rectification of Li+ transport in amorphous TiO <i>x</i> thin films grown by mist CVD

Y Y. Yamamoto (AMAYA Co., Ltd. 2 , Koshigaya, Saitama 343-0822,) F F. Kobayashi (Graduate School of Engineering, Kanagawa University 1 , Yokohama 220-8686,) Y Y. Wasai (HORIBA Techno Service Co., Ltd. 3 , Kanda, Tokyo 101-0063,) H H. Kurihara (Saitama Prefecture Industrial Technology Center (SAITEC) 4 , Saitama 333-0844,) H H. He H H. Sone (Graduate School of Science and Engineering, Saitama University 5 , Saitama 338-8570,) T T. Ohno (AMAYA Co., Ltd. 2 , Koshigaya, Saitama 343-0822,) H H. Shirai (Graduate School of Engineering, Kanagawa University 1 , Yokohama 220-8686,)

Abstract

Amorphous metal oxide interlayers are widely used to stabilize Li+ transport at battery interfaces, yet the underlying transport mechanisms remain unclear. Here, Li+ transport in amorphous TiOx (a-TiOx) thin films prepared by mist chemical vapor deposition was investigated by comparing electrochemical lithiation with concentration-driven Li+ insertion induced by LiPF6 exposure. Electrochemical lithiation enables redox-assisted, dynamically activated Li+ diffusion accompanied by partial Ti4+ reduction, whereas LiPF6 exposure results in diffusion-limited Li+ transport without significant electronic reduction. Depth-resolved glow discharge optical emission spectroscopy and spectroscopic ellipsometry clearly distinguish these two regimes. In addition, dielectric contrast between the electrolyte, a-TiOx, and graphite is proposed to generate internal electric fields that directionally bias Li+ transport. A Drude-like sub-gap optical response originates from field-induced polarization and localized electronic states rather than metallic conduction. These results highlight the importance of dielectric-field effects in amorphous oxide interlayers for improving interfacial stability and rate performance in lithium-based batteries.

Article Details

Volume / Issue Vol. 140, Issue 6
Published August 14, 2026
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (8)

Y

Y. Yamamoto

AMAYA Co., Ltd. 2 , Koshigaya, Saitama 343-0822,

F

F. Kobayashi

Graduate School of Engineering, Kanagawa University 1 , Yokohama 220-8686,

Y

Y. Wasai

HORIBA Techno Service Co., Ltd. 3 , Kanda, Tokyo 101-0063,

H

H. Kurihara

Saitama Prefecture Industrial Technology Center (SAITEC) 4 , Saitama 333-0844,

H

H. He

H

H. Sone

Graduate School of Science and Engineering, Saitama University 5 , Saitama 338-8570,

T

T. Ohno

AMAYA Co., Ltd. 2 , Koshigaya, Saitama 343-0822,

H

H. Shirai

Graduate School of Engineering, Kanagawa University 1 , Yokohama 220-8686,