Electron beam irradiation-induced transport and recombination in p-type gallium oxide grown on (001) <i>β</i> -Ga2O3 substrate

G Gabriel Marciaga (Department of Physics, University of Central Florida 1 , Orlando, Florida 32816,) J Jian-Sian Li (Department of Chemical Engineering, University of Florida 1 , Gainesville, Florida 32611,) C Chao-Ching Chiang (Department of Chemical Engineering, University of Florida 1 , Gainesville, Florida 32611,) F Fan Ren S Stephen J. Pearton (Department of Materials Science and Engineering, University of Florida 2 , Gainesville, Florida 32611,) C Corinne Sartel (Groupe d’Etude de la Matière Condensée, Université Paris-Saclay, Université de Versailles Saint Quentin en Yvelines—CNRS 4 , 45 Av. des Etats-Unis, Versailles Cedex 78035,) Z Zeyu Chi (Groupe d’Etude de la Matière Condensée, Université Paris-Saclay, Université de Versailles Saint Quentin en Yvelines—CNRS 4 , 45 Av. des Etats-Unis, Versailles Cedex 78035,) Y Yves Dumont (Groupe d’Etude de la Matière Condensée, Université Paris-Saclay, Université de Versailles Saint Quentin en Yvelines—CNRS 4 , 45 Av. des Etats-Unis, Versailles Cedex 78035,) E Ekaterine Chikoidze (Groupe d’Etude de la Matière Condensée, Université Paris-Saclay, Université de Versailles Saint Quentin en Yvelines—CNRS 4 , 45 Av. des Etats-Unis, Versailles Cedex 78035,) A Alfons Schulte (Department of Physics, University of Central Florida 1 , Orlando, Florida 32816,) A Arie Ruzin (School of Electrical Engineering, Tel Aviv University 6 , Tel Aviv 69978,) L Leonid Chernyak (Department of Physics, University of Central Florida 1 , Orlando, Florida 32816,)

Abstract

This study investigates minority electron diffusion length and carrier recombination phenomena in p-type 300 nm-thick Ga2O3 films homoepitaxially grown over a (001) tin-doped β-Ga2O3 conductive substrate. This research is novel due to its systematic and near-simultaneous measurements in the top layer of a p-Ga2O3/n-Ga2O3 structure using independent electron beam-induced current and cathodoluminescence techniques. Previous work primarily focused on heteroepitaxial architectures or gallium oxide grown over insulating substrates of the same material. In this work, the activation energies related to point defects in gallium oxide were extracted from temperature-dependent incremental electron beam irradiation experiments to gain insight into the defect landscape and its influence on minority carrier transport and recombination dynamics.

Article Details

Volume / Issue Vol. 138, Issue 7
Published August 21, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (12)

G

Gabriel Marciaga

Department of Physics, University of Central Florida 1 , Orlando, Florida 32816,

J

Jian-Sian Li

Department of Chemical Engineering, University of Florida 1 , Gainesville, Florida 32611,

C

Chao-Ching Chiang

Department of Chemical Engineering, University of Florida 1 , Gainesville, Florida 32611,

F

Fan Ren

S

Stephen J. Pearton

Department of Materials Science and Engineering, University of Florida 2 , Gainesville, Florida 32611,

C

Corinne Sartel

Groupe d’Etude de la Matière Condensée, Université Paris-Saclay, Université de Versailles Saint Quentin en Yvelines—CNRS 4 , 45 Av. des Etats-Unis, Versailles Cedex 78035,

Z

Zeyu Chi

Groupe d’Etude de la Matière Condensée, Université Paris-Saclay, Université de Versailles Saint Quentin en Yvelines—CNRS 4 , 45 Av. des Etats-Unis, Versailles Cedex 78035,

Y

Yves Dumont

Groupe d’Etude de la Matière Condensée, Université Paris-Saclay, Université de Versailles Saint Quentin en Yvelines—CNRS 4 , 45 Av. des Etats-Unis, Versailles Cedex 78035,

E

Ekaterine Chikoidze

Groupe d’Etude de la Matière Condensée, Université Paris-Saclay, Université de Versailles Saint Quentin en Yvelines—CNRS 4 , 45 Av. des Etats-Unis, Versailles Cedex 78035,

A

Alfons Schulte

Department of Physics, University of Central Florida 1 , Orlando, Florida 32816,

A

Arie Ruzin

School of Electrical Engineering, Tel Aviv University 6 , Tel Aviv 69978,

L

Leonid Chernyak

Department of Physics, University of Central Florida 1 , Orlando, Florida 32816,