Electroelastic guided wave dispersion in piezoelectric plates: Spectral methods and laser-ultrasound experiments

D D. A. Kiefer (Institut Langevin, ESPCI Paris, Université PSL, CNRS 1 , 75005 Paris,) G G. Watzl (Research Center for Non Destructive Testing GmbH 2 , Altenberger Str. 69, 4040 Linz,) K K. Burgholzer (Institute of Semiconductor and Solid State Physics, Johannes Kepler University Linz 3 , Altenberger Str. 69, 4040 Linz,) M M. Ryzy (Research Center for Non Destructive Testing GmbH 2 , Altenberger Str. 69, 4040 Linz,) C C. Grünsteidl (Research Center for Non Destructive Testing GmbH 2 , Altenberger Str. 69, 4040 Linz,)

Abstract

Electroelastic waves in piezoelectric media are widely used in sensing and filtering applications. Despite extensive research, computing the guided wave dispersion remains challenging. This paper presents semi-analytical approaches based on spectral methods to efficiently and reliably compute dispersion curves. We systematically assess the impact of electrical boundary conditions on a 128° Y-cut LiNbO3 wafer, examining open–open, open–shorted, and shorted–shorted surface configurations. Multi-modal dispersion maps obtained from laser-ultrasonic experiments for each boundary condition exhibit excellent agreement with the computational predictions. A straightforward implementation of the spectral collocation method is made available as GEW piezo plate (https://doi.org/10.5281/zenodo.14205789), while the spectral element method is integrated to GEWtool (http://doi.org/10.5281/zenodo.10114243) for multilayered plates. Therewith, we aim to make advanced semi-analytical techniques more accessible to physicists and engineers relying on dispersion analysis.

Article Details

Volume / Issue Vol. 137, Issue 11
Published March 21, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (5)

D

D. A. Kiefer

Institut Langevin, ESPCI Paris, Université PSL, CNRS 1 , 75005 Paris,

G

G. Watzl

Research Center for Non Destructive Testing GmbH 2 , Altenberger Str. 69, 4040 Linz,

K

K. Burgholzer

Institute of Semiconductor and Solid State Physics, Johannes Kepler University Linz 3 , Altenberger Str. 69, 4040 Linz,

M

M. Ryzy

Research Center for Non Destructive Testing GmbH 2 , Altenberger Str. 69, 4040 Linz,

C

C. Grünsteidl

Research Center for Non Destructive Testing GmbH 2 , Altenberger Str. 69, 4040 Linz,