Electric field sensing via Rydberg electromagnetically induced transparency using Zeeman and Stark effects

Y Yu-Chi Chen S Shao-Cheng Fang (Department of Physics, National Sun Yat-Sen University , Kaohsiung 80424,) H Hsuan-Jui Su (Department of Physics, National Sun Yat-Sen University , Kaohsiung 80424,) Y Yi-Hsin Chen

Abstract

Rydberg-assisted atomic electrometry with thermal vapors offers a promising approach for detecting external electric fields. However, this technique presents significant challenges for measuring low frequencies due to the effects of metal-alkali atoms adsorbed on the interior surface of the vacuum chamber. In this work, we apply high-contrast Rydberg electromagnetically induced transparency (EIT) spectroscopy to systematically investigate these effects, including the influence of laser power and electric field strength. We demonstrate the ability to measure electric field frequencies ranging from 10 Hz to 1 MHz. Additionally, this study identifies a fundamental limit for data capacity in such measurements. Furthermore, we propose a method for precise Stark shift measurements by locking the coupling laser to Zeeman-split Rydberg EIT peaks. Using the Zeeman shift in a reference cell as a stable frequency reference, we are able to track Stark-induced shifts in a science cell and confirm excellent agreement with theoretical predictions. These results provide valuable insights for future precision measurement techniques and field sensing applications based on Rydberg atom systems.

Article Details

Volume / Issue Vol. 138, Issue 9
Published September 07, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (4)

Y

Yu-Chi Chen

S

Shao-Cheng Fang

Department of Physics, National Sun Yat-Sen University , Kaohsiung 80424,

H

Hsuan-Jui Su

Department of Physics, National Sun Yat-Sen University , Kaohsiung 80424,

Y

Yi-Hsin Chen