Dynamic buckling of Si tetramers on the Si(111)-7 × 7 surface

R R. Zhachuk (Department of Physics and i3N, University of Aveiro, Campus Santiago 1 , 3810-193 Aveiro,) J J. Coutinho D D. Sheglov (Institute of Semiconductor Physics 2 , pr. Lavrentyeva 13, Novosibirsk 630090,)

Abstract

The atomic structure of Si tetramers that form on the Si(111)-7 × 7 surface during homoepitaxy is investigated by means of first-principles calculations with the currently available atomistic model as a starting point. It is demonstrated that the rectangular shape of the Si tetramer is unstable against buckling. The comparison of the calculated results with the available scanning tunneling microscopy (STM) data provides a new understanding of the problem, indicating that the recorded STM images are influenced by dynamic buckling.

Article Details

Volume / Issue Vol. 162, Issue 23
Published June 21, 2025
ISSN 0021-9606
Publisher American Institute of Physics

Journal Info

The Journal of Chemical Physics

American Institute of Physics

ISSN: 0021-9606 Physical Sciences

Authors (3)

R

R. Zhachuk

Department of Physics and i3N, University of Aveiro, Campus Santiago 1 , 3810-193 Aveiro,

J

J. Coutinho

D

D. Sheglov

Institute of Semiconductor Physics 2 , pr. Lavrentyeva 13, Novosibirsk 630090,