Direct measurement of reflection loss and electromagnetic parameter retrieval in high-loss materials

Abstract

Electromagnetic interference shielding (EMIS) and microwave absorption (MA) are two ways to tackle the deteriorating electromagnetic pollution. Generally, they present contradictory electromagnetic behavior, and it is challenging to simultaneously achieve both EMIS and MA properties within a single material. Thus, highly absorbed EMIS (HA-EMIS) material is a compromising solution. However, the electromagnetic parameter calculation method of MA is unsuitable for HA-EMI materials, severely hindering the unification of EMIS and MA. To address this issue, we propose both a new theoretical method for extracting the electromagnetic parameters of non-magnetic high-loss materials and a direct measurement technique for MA property. The validity of the proposed approach is verified through both simulations and experiments. These results indicate that high EMIS materials with excellent MA property are expected to be developed in the near future under the guidance of our work, facilitating the integration of these two research areas.