Detecting ion pairing in sodium fluoride solutions with dielectric spectroscopy
Abstract
The dielectric response of an ionic solution includes ionic diffusion, solvent molecule reorientation, and the intermolecular interactions between solvent, cations, and anions. While ionic diffusion and solvent reorientation produce large responses in the dielectric spectra, the contributions of the ion–ion and ion–water interactions can be difficult to measure and compute. Here, we combine computational and experimental techniques to investigate the impact of ion–ion and ion–water interactions in aqueous sodium fluoride solutions and determine whether an ion pairing peak exists in the dielectric spectra. We use our recently developed direct electric field approach to perform frequency-resolved configurational analysis of ion pairing. From this analysis, we identify a Debye peak associated with the reorientation of ion pairs. Our broadband microwave microfluidic spectra of sodium fluoride solutions further support the existence of a low-frequency Debye relaxation due to ion pairs in the solution.
Article Details
Journal Info
The Journal of Chemical Physics
American Institute of Physics
Authors (12)
Michael Woodcox
Theiss Research 1 , P.O. Box 127, La Jolla, California 92038,
Sarah R. Evans
RF Technology Division, National Institute of Standards and Technology 2 , 325 Broadway, Boulder, Colorado 80305,
Aaron M. Hagerstrom
Communications Technology Laboratory, National Institute of Standards and Technology 4 , 325 Broadway, Boulder, Colorado 80305,
Rebecca A. Bone
Theiss Research 2 , P.O. Box 127, La Jolla, California 92038,
Nicholas R. Jungwirth
RF Technology Division, National Institute of Standards and Technology 2 , 325 Broadway, Boulder, Colorado 80305,
Spencer Mattes
Department of Chemistry and Chemical Biology, Cornell University 5 , 410 Thurston Ave., Ithaca, New York 14850,
Avik Mahata
Material Measurement Laboratory, National Institute of Standards and Technology 2 , 100 Bureau Dr., Gaithersburg, Maryland 20899,
Nathan D. Orloff
RF Technology Division, National Institute of Standards and Technology 2 , 325 Broadway, Boulder, Colorado 80305,
Chris Muzny
Communications Technology Laboratory, National Institute of Standards and Technology 4 , 325 Broadway, Boulder, Colorado 80305,
James C. Booth
RF Technology Division, National Institute of Standards and Technology 2 , 325 Broadway, Boulder, Colorado 80305,
Kathleen A. Schwarz
Material Measurement Laboratory, National Institute of Standards and Technology 2 , 100 Bureau Dr., Gaithersburg, Maryland 20899,
Angela C. Stelson
RF Technology Division, National Institute of Standards and Technology 2 , 325 Broadway, Boulder, Colorado 80305,