Degradation modeling and remaining useful life prediction for electronic device under multiple stress influences
C
Changjun Li
J
Jinjun Cheng
H
Haizhen Zhu
B
Bincheng Wen
X
Xin Zhao
W
Weijie Kang
Article Details
Journal
Scientific Reports
Volume / Issue
Vol. 15, Issue 1
Published
May 31, 2025
ISSN
2045-2322
Publisher
Nature Portfolio
Authors (6)
C
Changjun Li
J
Jinjun Cheng
H
Haizhen Zhu
B
Bincheng Wen
X
Xin Zhao
W
Weijie Kang
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