Deep learning denoising enables rapid SEM imaging under charging conditions for FE SEM, CD SEM, and review SEM

H Hyungjoo Park B Beom-Seok Oh K Kuk Jin Jang

Article Details

Volume / Issue Vol. 16, Issue 1
Published December 29, 2025
ISSN 2045-2322
Publisher Nature Portfolio

Journal Info

Scientific Reports

Nature Portfolio

ISSN: 2045-2322 Open Access Life Sciences

Authors (3)

H

Hyungjoo Park

B

Beom-Seok Oh

K

Kuk Jin Jang