Damage effects in GaN high electron mobility transistor power amplifier induced by high power microwave pulses
J
Jingtao Zhao
G
Gang Zhao
(Department of Systems Immunology, Helmholtz Centre for Infection Research)
Q
Quanyou Chen
Z
Zidong Chen
L
Lei Cao
X
Xixi Feng
Z
Zhong Liu
C
Chaoyang Chen
Article Details
Journal
Scientific Reports
Volume / Issue
Vol. 15, Issue 1
Published
February 18, 2025
ISSN
2045-2322
Publisher
Nature Portfolio
Authors (8)
J
Jingtao Zhao
G
Gang Zhao
Department of Systems Immunology, Helmholtz Centre for Infection Research
Q
Quanyou Chen
Z
Zidong Chen
L
Lei Cao
X
Xixi Feng
Z
Zhong Liu
C
Chaoyang Chen
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