Coexistence of Ohmic Contact and Fermi Level Pinning at 2D Electride/2D Semiconductor Interfaces

C Chengfeng Pan (Key Laboratory of Polar Materials and Devices (MOE), and Department of Electronics) D Dazhong Sun (College of Physics and Center of Quantum Materials and Devices) Z Zhennan Lin (Key Laboratory of Polar Materials and Devices (MOE), and Department of Electronics) X Xianghong Niu (School of Science) Y Yu-Ning Wu (Key Laboratory of Polar Materials and Devices (MOE), School of Information and Electronic Engineering (School of Integrated Circuits Science and Engineering), East China Normal University, Shanghai, China.)

Article Details

Volume / Issue Vol. 148, Issue 1
Published January 14, 2026
Pages 1655-1661
ISSN 0002-7863
Publisher American Chemical Society

Journal Info

Journal of the American Chemical Society

American Chemical Society

ISSN: 0002-7863 Physical Sciences

Authors (5)

C

Chengfeng Pan

Key Laboratory of Polar Materials and Devices (MOE), and Department of Electronics

D

Dazhong Sun

College of Physics and Center of Quantum Materials and Devices

Z

Zhennan Lin

Key Laboratory of Polar Materials and Devices (MOE), and Department of Electronics

X

Xianghong Niu

School of Science

Y

Yu-Ning Wu

Key Laboratory of Polar Materials and Devices (MOE), School of Information and Electronic Engineering (School of Integrated Circuits Science and Engineering), East China Normal University, Shanghai, China.