Carrier thermalization and biexciton formation in a polar ZnO/Zn0.84Mg0.16O quantum well probed by ultrafast broadband spectroscopy

D Daniel O. Siebadji Tchuimeni (IPCMS UMR 7504 CNRS - université de Strasbourg 23 1 , rue du Lœss B.P. 43, F-67034 Strasbourg CEDEX 2,) M Marc Ziegler (IPCMS UMR7504 CNRS—Université de Strasbourg 1 , 23, rue du Lœss B.P. 43, F-67034 Strasbourg CEDEX 2,) O Olivier Crégut (IPCMS UMR7504 CNRS—Université de Strasbourg 1 , 23, rue du Lœss B.P. 43, F-67034 Strasbourg CEDEX 2,) P Pierre Gilliot (IPCMS UMR7504 CNRS—Université de Strasbourg 1 , 23, rue du Lœss B.P. 43, F-67034 Strasbourg CEDEX 2,) C Christian Morhain (Université Côte d’Azur, CNRS, CRHEA Rue B. Grégory 3 , Valbonne 06560,) A Andrea Balocchi (CNRS, LPCNO 3 , Toulouse,) M Mathieu Gallart (IPCMS UMR7504 CNRS—Université de Strasbourg 1 , 23, rue du Lœss B.P. 43, F-67034 Strasbourg CEDEX 2,)

Abstract

We investigate the ultrafast dynamics of excitons in a 2.6 nm-thick ZnO/Zn0.84Mg0.16O quantum well grown on a c-axis sapphire substrate, using non-degenerate time-resolved pump–probe spectroscopy. A pump pulse at 266 nm generates photocarriers within the ZnMgO barriers, and their dynamics is monitored through time-resolved differential reflectance measurements using a supercontinuum probe spanning the 345–400 nm spectral range. Photocarriers generated in the barriers rapidly relax into the quantum well, where they form excitons within sub-picosecond timescales. These excitons quickly thermalize and become localized, likely due to interface disorder or well-width fluctuations, as supported by photoluminescence measurements showing a clear Stokes shift and the absence of free exciton emission. A phonon-assisted absorption process, leading to the effective thermalization of excitons, is observed and analyzed. We identify moreover a negative differential reflectance feature as a photoinduced absorption into a biexciton state, with a binding energy ranging from 18 to 22 meV depending on temperature.

Article Details

Volume / Issue Vol. 138, Issue 5
Published August 07, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (7)

D

Daniel O. Siebadji Tchuimeni

IPCMS UMR 7504 CNRS - université de Strasbourg 23 1 , rue du Lœss B.P. 43, F-67034 Strasbourg CEDEX 2,

M

Marc Ziegler

IPCMS UMR7504 CNRS—Université de Strasbourg 1 , 23, rue du Lœss B.P. 43, F-67034 Strasbourg CEDEX 2,

O

Olivier Crégut

IPCMS UMR7504 CNRS—Université de Strasbourg 1 , 23, rue du Lœss B.P. 43, F-67034 Strasbourg CEDEX 2,

P

Pierre Gilliot

IPCMS UMR7504 CNRS—Université de Strasbourg 1 , 23, rue du Lœss B.P. 43, F-67034 Strasbourg CEDEX 2,

C

Christian Morhain

Université Côte d’Azur, CNRS, CRHEA Rue B. Grégory 3 , Valbonne 06560,

A

Andrea Balocchi

CNRS, LPCNO 3 , Toulouse,

M

Mathieu Gallart

IPCMS UMR7504 CNRS—Université de Strasbourg 1 , 23, rue du Lœss B.P. 43, F-67034 Strasbourg CEDEX 2,