Carrier concentration adjustment in graphene QHR devices for metrology applications

S Sergiy Rozhko (National Physical Laboratory , Hampton Road, Teddington, Middlesex TW11 0LW,) N Nick Fletcher (National Physical Laboratory , Hampton Road, Teddington, Middlesex TW11 0LW,) S Stephen P. Giblin (National Physical Laboratory , Hampton Road, Teddington, Middlesex TW11 0LW,)

Abstract

We report on the reversible tuning of the carrier concentration n of molecular-doped epigraphene designed for application as a quantum Hall resistance standard. Fine tuning of the carrier concentration required for optimal realization of the Hall resistance quantization is achieved by annealing, to increase n, or by pulsed application of ions created by an electrostatic discharge above the surface of the graphene device to decrease n. We also report on a rapid reduction in n when a device is exposed to air. These observations are part of a growing body of information on the long-term stability of epigraphene primary resistance standards.

Article Details

Volume / Issue Vol. 138, Issue 13
Published October 07, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (3)

S

Sergiy Rozhko

National Physical Laboratory , Hampton Road, Teddington, Middlesex TW11 0LW,

N

Nick Fletcher

National Physical Laboratory , Hampton Road, Teddington, Middlesex TW11 0LW,

S

Stephen P. Giblin

National Physical Laboratory , Hampton Road, Teddington, Middlesex TW11 0LW,