Bending and vibration of nanoplates: Symmetry lowering and surface elastic effects

X Xiao Lei (Laboratory of Retrovirology, The Rockefeller University) J Jiangang Li G Guohong Yun (Modern Physics Research Center, College of Physics and Electronic Information, Inner Mongolia Normal University 3 , Hohhot 010022,) N Narsu Bai

Abstract

In this study, we investigate the bending and vibration of nanoplates under the coupled effects of surface elasticity, residual surface stress, symmetry lowering, and additional elastic constants. A significant size dependence is observed for the maximum deflections and natural frequencies at nanoscale. Increasing nanoplate thickness reduces surface effects and restores symmetry, causing deflections and frequencies to converge to the conventional Kirchhoff plate limit. Si 〈100〉 oriented nanoplates with various surface reconstructions were adopted as examples. In all cases except the (2 × 1)-type reconstruction on both surfaces, the maximum deflection not only decreases in magnitude but also reverses direction. The resultant positive residual stresses, resulting from specific combinations of surface reconstruction on the upper and lower surfaces, can increase the nanoplate's deflection and vibration frequency, while negative values have the opposite effect. The resultant negative residual stresses, arising from surface reconstruction on the upper and lower surfaces, are a more critical factor influencing the bending characteristics than surface elasticity and symmetry lowering, whereas the reverse holds for resultant positive residual stresses. A decrease in the maximum deflection is associated with both a reduction in resultant residual stresses and an increase in bending stiffness. Due to the reduced influence of surface effects and symmetry lowering on higher-order vibration modes, the normalized natural frequency of the nanoplates tends to a stable value in higher-order modes.

Article Details

Volume / Issue Vol. 140, Issue 4
Published July 28, 2026
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (4)

X

Xiao Lei

Laboratory of Retrovirology, The Rockefeller University

J

Jiangang Li

G

Guohong Yun

Modern Physics Research Center, College of Physics and Electronic Information, Inner Mongolia Normal University 3 , Hohhot 010022,

N

Narsu Bai