Application of convolutional neural networks in focused ion beam scanning electron microscopy image denoising
W
Wen Xu
D
Dong Zhao
B
Baoding Zhu
X
Xiaopan Kou
Y
Ying Zhou
C
Chuanrui Sun
X
Xin Nie
Article Details
Journal
Scientific Reports
Volume / Issue
Vol. 16, Issue 1
Published
December 18, 2025
ISSN
2045-2322
Publisher
Nature Portfolio
Authors (7)
W
Wen Xu
D
Dong Zhao
B
Baoding Zhu
X
Xiaopan Kou
Y
Ying Zhou
C
Chuanrui Sun
X
Xin Nie
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