Analysis of the film thickness dependence of the ferroelectric properties of epitaxial PMN–PT thin films on a thin PZT interfacial layer
Abstract
Perovskite phase-pure, (001)-oriented, epitaxial [Pb(Mg1/3Nb2/3)O3]0.67–(PbTiO3)0.33 (PMN–PT) thin films with six different thicknesses in the range 100–1000 nm were deposited on single-crystal, (001)-oriented SrTiO3 substrates on a 25 nm Pb(Zr0.5Ti0.5)O3 interfacial layer. The measured ferroelectric, dielectric, and piezoelectric property values of parallel-plate capacitor structures increase with PMN–PT layer thickness. This is explained by increasing local polarization further away from the substrate, which is deduced from the properties of the thickness series. The polarization change is explained by strain relaxation with increasing thickness and also indicates a symmetry change from rhombohedral to tetragonal symmetry above a thickness of 800 nm. This correlates with an earlier found abrupt change of Young's modulus and hardness.
Article Details
Journal Info
Journal of Applied Physics
American Institute of Physics
Authors (6)
M. Boota
MESA+ Institute for Nanotechnology, University of Twente 1 , P.O. Box 217, Enschede 7500AE,
E. P. Houwman
MESA+ Institute for Nanotechnology, University of Twente 1 , P.O. Box 217, Enschede 7500AE,
G. Lanzara
Engineering Department, University of Rome “ROMA TRE,” 2 Via Della Vasca Navale 79, 00146 Rome,
E. Bemporad
Engineering Department, University of Rome “ROMA TRE,” 2 Via Della Vasca Navale 79, 00146 Rome,
G. Koster
MESA+ Institute for Nanotechnology, University of Twente 1 , P.O. Box 217, Enschede 7500AE,
G. Rijnders
MESA+ Institute for Nanotechnology, University of Twente 1 , P.O. Box 217, Enschede 7500AE,