An ionic polymer route to a stable unpinning of the Fermi level of highly doped graphene

A A. Pradeepkumar (School of Electrical and Data Engineering, Faculty of Engineering and Information Technology, University of Technology Sydney 1 , Sydney, New South Wales 2007,) Y Y. Yang E E. Castañeda (Departamento de Química Inorgánica, Escuela de Química, Facultad de Química y de Farmacia, Pontificia Universidad Católica de Chile 3 , Santiago 7820436,) F F. A. Angel (Departamento de Química Inorgánica, Escuela de Química, Facultad de Química y de Farmacia, Pontificia Universidad Católica de Chile 3 , Santiago 7820436,) F F. Iacopi (School of Electrical and Data Engineering, Faculty of Engineering and Information Technology, University of Technology Sydney 1 , Sydney, New South Wales 2007,)

Abstract

Epitaxial graphene on cubic silicon carbide on silicon could enable unique optical metasurface devices seamlessly integrated with CMOS technologies. However, one of the most promising methods to obtain large-scale epitaxial graphene on this challenging system typically leads to a highly p-type-doped graphene with a Fermi level pinned at ∼0.55 eV below the Dirac point. Hence, the use of conventional gate dielectric materials such as SiO2 and Si3N4 precludes the tuning of the graphene carrier concentration. We demonstrate that this limitation can be overcome with the use of polyethyleneimine (PEI) as a gate dielectric material for graphene field-effect transistors. We achieve significant tuning of the graphene's Fermi level, enabling ambipolar operation exceeding a 3 eV window. In addition, we demonstrate that excellent stability of the PEI-based devices can be achieved, thanks to the addition of a thin protective oxide film. These findings highlight the potential of ionic polymers for advancing reconfigurable graphene-based devices for photonic applications.

Article Details

Volume / Issue Vol. 137, Issue 22
Published June 14, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (5)

A

A. Pradeepkumar

School of Electrical and Data Engineering, Faculty of Engineering and Information Technology, University of Technology Sydney 1 , Sydney, New South Wales 2007,

Y

Y. Yang

E

E. Castañeda

Departamento de Química Inorgánica, Escuela de Química, Facultad de Química y de Farmacia, Pontificia Universidad Católica de Chile 3 , Santiago 7820436,

F

F. A. Angel

Departamento de Química Inorgánica, Escuela de Química, Facultad de Química y de Farmacia, Pontificia Universidad Católica de Chile 3 , Santiago 7820436,

F

F. Iacopi

School of Electrical and Data Engineering, Faculty of Engineering and Information Technology, University of Technology Sydney 1 , Sydney, New South Wales 2007,