Active wetting transitions induced by rotational noise at solid interfaces

S Suchismita Das (Department of Physics, Indian Institute of Technology Bombay 1 , Mumbai 400076,) R Raghunath Chelakkot (Department of Physics, Indian Institute of Technology Bombay 1 , Mumbai 400076,)

Abstract

We investigate the wetting transitions displayed by the collection of active Brownian particles confined within rigid, impenetrable, flat walls. In our computational study using Brownian dynamics simulations, the wall–particle interactions are implemented with a short-range repulsive potential. Our analyses reveal that an enhanced rotational diffusion at the walls can be used as a control parameter for wetting transitions in the dense aggregates of active particles at the wall. Increasing the wall rotational diffusion destabilizes a uniform, complete wetting state, and the aggregate shows morphological transitions. We observe a sequence of morphological transitions with an increase in wall rotational diffusion: symmetric complete wetting, asymmetric complete wetting, partial wetting with droplet formation, and drying. We compute the contact angle in the PW state as a function of activity and rotational noise. Our analysis indicates that these transitions are linked to enhanced kinetic energy fluctuations of particles and bubble formations in the dense state. We further characterize the nature of these transitions by systematically analyzing an order parameter. Our work shows that modifying local reorientation rates alone is sufficient to induce wetting transitions in active systems.

Article Details

Volume / Issue Vol. 163, Issue 1
Published July 07, 2025
ISSN 0021-9606
Publisher American Institute of Physics

Journal Info

The Journal of Chemical Physics

American Institute of Physics

ISSN: 0021-9606 Physical Sciences

Authors (2)

S

Suchismita Das

Department of Physics, Indian Institute of Technology Bombay 1 , Mumbai 400076,

R

Raghunath Chelakkot

Department of Physics, Indian Institute of Technology Bombay 1 , Mumbai 400076,