A SURVEY ON ADVANCED ATTENDANCE API

J J Jeevandeep C Chintan G D Deekshith G M A Anirudh C R S Sandeep R

Abstract

In today's rapidly changing world, automatic face recognition (AFR) technologies have made significant advances. Keeping up with the attendance register day by day is a troublesome and tedious process. There are many robotized strategies for a similar application like biometrics, radio-frequency identification (RFID), iris detection, voice detection, and more. The objective of this paper is to review some of the state-of-the-art techniques used in the implementation of marking attendance. The existing methodologies show that there is a scope for improvement in the implementation of smart attendance. In our future work, we want to present a framework by utilizing deep learning and thereby tap into the potential that it guarantees in the field of face-based biometrics.

Article Details

Volume / Issue Vol. 9, Issue 2
Published March 04, 2022
Pages 1-4
Publisher AM Publications

Authors (5)

J

J Jeevandeep

C

Chintan G

D

Deekshith G M

A

Anirudh C R

S

Sandeep R