A Bayesian desmearing algorithm for Bonse–Hart USANS with anisotropic scattering

C Chi-Huan Tung (Neutron Scattering Division, Oak Ridge National Laboratory 1 , Oak Ridge, Tennessee 37831,) G Guan-Rong Huang (Department of Engineering and System Science, National Tsing Hua University 2 , Hsinchu 30013,) Y Yangyang Wang (Wuya College of Innovation) J Jan-Michael Carrillo (Center for Nanophase Materials Sciences, Oak Ridge National Laboratory 3 , Oak Ridge, Tennessee 37831,) Y Yuya Shinohara (Materials Science and Technology Division, Oak Ridge National Laboratory 6 , Oak Ridge, Tennessee 37831,) C Changwoo Do (Neutron Scattering Division) G Gernot Rother (Neutron Scattering Division, Oak Ridge National Laboratory 1 , Oak Ridge, Tennessee 37831,) Y Yingrui Shang (Neutron Scattering Division, Oak Ridge National Laboratory 1 , Oak Ridge, Tennessee 37831,) W Wei-Ren Chen (Neutron Scattering Division, Oak Ridge National Laboratory 1 , Oak Ridge, Tennessee 37831,)

Abstract

Ultra-small-angle neutron scattering (USANS) using Bonse–Hart optics provides micrometer-scale structural insights but suffers from severe slit-geometry smearing. While well-established for isotropic systems, quantitative desmearing of anisotropic data remains a challenge because conventional corrections break down for non-radial scattering. We address this by developing a resolution-aware Bayesian framework that explicitly incorporates anisotropy via an affine deformation to the scattering pattern, guided by the principle of parsimony. This results in orientation-resolved point-spread functions that enable a self-consistent determination of both the resolution and deformation parameters. Using Gaussian process regression with uncertainty quantification and a probabilistic correction for multiple scattering, we demonstrate the framework’s effectiveness through numerical benchmarks and experimental studies of a stretched polymer melt. Our approach enables the seamless integration of SANS and USANS data, facilitating quantitative structural analysis of deformed materials at nanometer to micrometer scales.

Article Details

Volume / Issue Vol. 164, Issue 16
Published April 28, 2026
ISSN 0021-9606
Publisher American Institute of Physics

Journal Info

The Journal of Chemical Physics

American Institute of Physics

ISSN: 0021-9606 Physical Sciences

Authors (9)

C

Chi-Huan Tung

Neutron Scattering Division, Oak Ridge National Laboratory 1 , Oak Ridge, Tennessee 37831,

G

Guan-Rong Huang

Department of Engineering and System Science, National Tsing Hua University 2 , Hsinchu 30013,

Y

Yangyang Wang

Wuya College of Innovation

J

Jan-Michael Carrillo

Center for Nanophase Materials Sciences, Oak Ridge National Laboratory 3 , Oak Ridge, Tennessee 37831,

Y

Yuya Shinohara

Materials Science and Technology Division, Oak Ridge National Laboratory 6 , Oak Ridge, Tennessee 37831,

C

Changwoo Do

Neutron Scattering Division

G

Gernot Rother

Neutron Scattering Division, Oak Ridge National Laboratory 1 , Oak Ridge, Tennessee 37831,

Y

Yingrui Shang

Neutron Scattering Division, Oak Ridge National Laboratory 1 , Oak Ridge, Tennessee 37831,

W

Wei-Ren Chen

Neutron Scattering Division, Oak Ridge National Laboratory 1 , Oak Ridge, Tennessee 37831,