Dat, V. K., Nguyen, M. C., Jeong, B. J., Duong, N. T., Do, V. D., Hong, C., Phuong, D. H., Vu, V. T., Kang, J., Zhang, X., Taylor, R. A., Kyhm, K., Yu, W. J., Choi, J., Kim, J. (2025). Van der Waals Integration of 1D Nb
                    <sub>2</sub>
                    Pd
                    <sub>3</sub>
                    Se
                    <sub>8</sub>
                    and 2D WSe
                    <sub>2</sub>
                    for Gate‐Tunable In‐Sensor Image Processing. Advanced Materials. https://doi.org/10.1002/adma.202500011