Tao, H., Chen, Y., He, S., Chen, B., Shang, Z., Ma, Z., Liu, X., Chai, L., Lin, Z. (2026). V
                    <sub>2</sub>
                    O
                    <sub>5</sub>
                    Surface Electronic Structure Suppresses Ethane Over‐Oxidation, Enabling 65% Ethylene Yield. Angewandte Chemie International Edition. https://doi.org/10.1002/anie.8633105