Juntaek Oh, Jaehyeon Son, Changhyeong Yoon, Eunsoo Hwang, Jinwoo Ahn, Jaewon Lee, Jinsoo Lee, Jiyong Shin, Donggun Lee, Seunga Lim, Jeongho Ahn, Younghoon Sohn, Sangjin Hyun, Myungjun Lee, Taeyong Jo. "Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology." Nature Communications, 2025. doi:10.1038/s41467-025-63511-1