Kudryashov, S. I., Podlesnykh, I. M., Dravin, V. A., Kovalev, M. S., Chizhov, P. A., Bulgakova, V. V., Ushakov, A. A., Goncharov, Y. G., Krasin, G. K., Kuzmin, E. V., Bondarenko, A. G., Maslov, P. A., Orekhov, N. D. (2026). Time-resolved non-contact THz diagnostics of impurity state in different sulfur-implanted/laser-annealed silicon samples. The Journal of Chemical Physics. https://doi.org/10.1063/5.0304765