Yue, S., Zhu, H., Shu, L., Su, J., Zhang, T., Chen, S., Wang, L., Zhang, X., Bu, J., Li, B. (2026). Study on the synergistic effect of electrical bias and proton irradiation on the electrical performance degradation of β -Ga2O3 Schottky barrier diodes. Applied Physics Letters. https://doi.org/10.1063/5.0327011