Feng, Y., Guo, H., Zhang, J., Ma, W., Ouyang, X., Zhang, F., Cao, Y., Ma, X., Hao, Y. (2026). Study on the single-event burnout mechanism of
                    <i>β-</i>
                    Ga2O3 heterojunction diodes under heavy-ion irradiation. Applied Physics Letters. https://doi.org/10.1063/5.0314929