Tong, Y., Wang, S., Zhang, Y., Liu, B., Zhang, G., Cai, Y., Wang, Y., Zhang, P., Wang, T., Gong, J. (2026). Spatially Quantitative Profiling of Defect Density for Hydrogen-Induced Passivation Mechanism of Metal–Insulator–Semiconductor Photoanodes. Journal of the American Chemical Society. https://doi.org/10.1021/jacs.6c01240