Song, X., Zhao, S., Gui, J., Wang, N., Wang, K., Du, L., Kong, Z., Yu, L., Zhang, G., Gao, L., You, S., Hao, Y., Zhang, J. (2025). Single-event burnout mechanism in
                    <b>β</b>
                    -Ga2O3 Schottky barrier diodes. Applied Physics Letters. https://doi.org/10.1063/5.0295377