Akira Yamakata, Junie Jhon M. Vequizo, Kazunari Domen. "Shallow Hole Trapping and Intrinsic Defect Tolerance in Visible-Light Photocatalysts: The Role of Lattice Relaxation and Electronic Screening." Journal of the American Chemical Society (2026). https://doi.org/10.1021/jacs.6c00026