Umapathi Krishnamoorthy, Choon Kit Chan, Chandrakant Sonawane, Amol Vedpathak, Subhav Singh, Deekshant Varsheny. "Self-supervised multi-resolution learning for label-agnostic morphology representation and clustering of semiconductor thin-film SEM defects." Scientific Reports, 2026. doi:10.1038/s41598-026-46947-3