Jingming Yao, Zhixuan Yu, Jun Ma, Zhangran Ye, Congcong Du, Jun Zhao, Jingzhao Chen, Hongjun Ye, Qiushi Dai, Hui Li, Yong Su, Jitong Yan, Dingding Zhu, Zaifa Wang, Xuedong Zhang, Zhaoyu Rong, Qiang Yu, Ziang Guo, Hailong Qiu, Zhenyu Wang, Lingyun Zhu, Yongfu Tang, Jianyu Huang. "Revealing interfacial failure mechanism of silicon based all solid state batteries via cryogenic electron microscopy." Nature Communications, 2025. doi:10.1038/s41467-025-64697-0