Scholl, Z., Frohlich, E., Rogers, N., Nguyen, P., Hase, B., Murphy, J. T., Toledo-Urena, J., Cobden, D., Heath, J. T. (2026). Reducing nonlinear effects in Kelvin probe force microscopy of back-gated 2D semiconductors. Applied Physics Letters. https://doi.org/10.1063/5.0323880