Shtyrov, A., Wilson, H., Slowik, D., Yamashita, K., Li, J., Wojdyr, M., Chen, S., McMullan, G., Short, J. M., Russo, C. J., Henderson, R., Murshudov, G. N. (2026). Measurement of atomic scattering factors by cryoelectron microscopy. Proceedings of the National Academy of Sciences. https://doi.org/10.1073/pnas.2528758123