Dale M. Waters, Bethany Thompson, Gergely Ferenczi, Ben Hourahine, Grzegorz Cios, Aimo Winkelmann, Christoph J. M. Stark, Christian Wetzel, Carol Trager-Cowan, Jochen Bruckbauer. "Investigation of (mis-)orientation in zincblende GaN grown on micro-patterned Si(001) using electron backscatter diffraction." Journal of Applied Physics, 2025. doi:10.1063/5.0244438