Raghavan, A., Pratiush, U., Valleti, M., Liu, R. (., Emery, R., Funakubo, H., Liu, Y., Rack, P., Kalinin, S. (2025). Invariant discovery of features across multiple length scales: Applications in microscopy and autonomous materials characterization. Journal of Applied Physics. https://doi.org/10.1063/5.0233070