Hibino, K., Olejníček, J., Yamanoi, K., Ponseca, C. S., Shuaib, A., Maruyama, Y., Písaříková, A., Kohout, M., Čada, M., Kapran, A., Akabe, Y., Sarukura, N., Hubička, Z., Ono, S., Cadatal-Raduban, M. (2025). Impact of electron cyclotron wave resonance plasma on defect reduction in ZnO thin films. Scientific Reports. https://doi.org/10.1038/s41598-025-88921-5