Mebarki, M. A., Ragnar, F. D. D. C., Joint, F., Meledin, D., Sundin, E., Thorsell, M., Rorsman, N., Belitsky, V., Desmaris, V. (2026). Gate-length scaling of AlGaN/GaN HEMTs for cryogenic low-noise operation. Applied Physics Letters. https://doi.org/10.1063/5.0325467